Effect of power cycling control strategies on failure modes and lifetime for power semiconductor devices
Maoyang Pan; Yanghai Wei; Erping Deng; Yuxing Yan; Hongyu Sun; Hao Liu; Yongzhang Huang
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.microrel.2026.116290
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Cite this source
Maoyang Pan; Yanghai Wei; Erping Deng; Yuxing Yan; Hongyu Sun; Hao Liu; Yongzhang Huang. Effect of power cycling control strategies on failure modes and lifetime for power semiconductor devices. Microelectronics Reliability. 2026-10. https://doi.org/10.1016/j.microrel.2026.116290