gEOL: A Gradient-Based End-of-Life Criterion for Power Semiconductor Modules
Yichi Zhang; Yi Zhang; Huai Wang
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Power Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tpel.2023.3339342
The original publisher provides the full text and its access options.
Cite this source
Yichi Zhang; Yi Zhang; Huai Wang. gEOL: A Gradient-Based End-of-Life Criterion for Power Semiconductor Modules. IEEE Transactions on Power Electronics. 2024-03. https://doi.org/10.1109/tpel.2023.3339342