Degradation Comparison of P-type Thin Film Transistor under Dynamic Gate Pulsed Stress
Xiangxu Tan; Huaisheng Wang; Mingxiang Wang; Dongli Zhang; Nannan Lv
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ipfa61654.2024.10691239
The original publisher provides the full text and its access options.
Cite this source
Xiangxu Tan; Huaisheng Wang; Mingxiang Wang; Dongli Zhang; Nannan Lv. Degradation Comparison of P-type Thin Film Transistor under Dynamic Gate Pulsed Stress. 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). 2024-07-15. https://doi.org/10.1109/ipfa61654.2024.10691239