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Research literature / Journal article

Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures

Tao Gong; Longqing Chen; Xiaoyi Wang; Yang Qiu; Huiyun Liu; Zixing Yang; Thomas Walther

Published
Publisher
MDPI AG
Journal / collection
Crystals
Research area
Semiconductors
Source type
Journal article
DOI
10.3390/cryst15020192

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Tao Gong; Longqing Chen; Xiaoyi Wang; Yang Qiu; Huiyun Liu; Zixing Yang; Thomas Walther. Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures. Crystals. 2025-02-17. https://doi.org/10.3390/cryst15020192

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