A Cell-aware Transistor State Stress Model and its Application for Quality Measurement
Stephan Eggersglüß; Andreas Glowatz
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Test Conference (ITC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/itc51657.2024.00016
The original publisher provides the full text and its access options.
Cite this source
Stephan Eggersglüß; Andreas Glowatz. A Cell-aware Transistor State Stress Model and its Application for Quality Measurement. 2024 IEEE International Test Conference (ITC). 2024-11-03. https://doi.org/10.1109/itc51657.2024.00016