Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization
Tinghuan Chen; Hao Geng; Qi Sun; Sanping Wan; Yongsheng Sun; Huatao Yu; Bei Yu
- Published
- Publisher
- Association for Computing Machinery (ACM)
- Journal / collection
- ACM Transactions on Design Automation of Electronic Systems
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1145/3659950
The original publisher provides the full text and its access options.
Cite this source
Tinghuan Chen; Hao Geng; Qi Sun; Sanping Wan; Yongsheng Sun; Huatao Yu; Bei Yu. Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization. ACM Transactions on Design Automation of Electronic Systems. 2024-08-13. https://doi.org/10.1145/3659950