Advancing silicon die area estimation for integrated circuit modeling in life-cycle assessments
Augustin Wattiez; Anne-Sophie Collin; Robin Dethienne; Tomasz Rola; Marina Proske; Thibault Pirson; Vincent Schellekens; David Bol
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- The International Journal of Life Cycle Assessment
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s11367-026-02754-6
The original publisher provides the full text and its access options.
Cite this source
Augustin Wattiez; Anne-Sophie Collin; Robin Dethienne; Tomasz Rola; Marina Proske; Thibault Pirson; Vincent Schellekens; David Bol. Advancing silicon die area estimation for integrated circuit modeling in life-cycle assessments. The International Journal of Life Cycle Assessment. 2026-10. https://doi.org/10.1007/s11367-026-02754-6