A Transistor Level Relational Semantics for Electrical Rule Checking by SMT Solving
Oussama Oulkaid; Bruno Ferres; Matthieu Moy; Pascal Raymond; Mehdi Khosravian; Ludovic Henrio; Gabriel Radanne
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.23919/date58400.2024.10546537
The original publisher provides the full text and its access options.
Cite this source
Oussama Oulkaid; Bruno Ferres; Matthieu Moy; Pascal Raymond; Mehdi Khosravian; Ludovic Henrio; Gabriel Radanne. A Transistor Level Relational Semantics for Electrical Rule Checking by SMT Solving. 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE). 2024-03-25. https://doi.org/10.23919/date58400.2024.10546537