Semiconductor electrical parameter measurement based on Hall effect and the improved mobility spectrum algorithm
Xin Wang; Ruiqiang Zhou; Yujie Zhang; Xianguang Fan
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Measurement
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.measurement.2024.115257
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Cite this source
Xin Wang; Ruiqiang Zhou; Yujie Zhang; Xianguang Fan. Semiconductor electrical parameter measurement based on Hall effect and the improved mobility spectrum algorithm. Measurement. 2024-10. https://doi.org/10.1016/j.measurement.2024.115257