A novel adaptation of Naive Bayes methods for improving semiconductor fab yield
Kevin D. Dayaratna; Michael C. McFarlane
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- International Journal of Data Science and Analytics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s41060-024-00560-7
The original publisher provides the full text and its access options.
Cite this source
Kevin D. Dayaratna; Michael C. McFarlane. A novel adaptation of Naive Bayes methods for improving semiconductor fab yield. International Journal of Data Science and Analytics. 2024-06-06. https://doi.org/10.1007/s41060-024-00560-7