Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Evolution of Transistor Architecture: From FinFET to Gate-All-Around Technology

Rajesh Arsid

Published
Publisher
Naksh Solutions
Journal / collection
International Journal of Advanced Research in Science, Communication and Technology
Research area
Semiconductors
Source type
Journal article
DOI
10.48175/ijarsct-24809

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Rajesh Arsid. Evolution of Transistor Architecture: From FinFET to Gate-All-Around Technology. International Journal of Advanced Research in Science, Communication and Technology. 2025-04-02. https://doi.org/10.48175/ijarsct-24809

Download RIS