Test Input Prioritization for Machine Learning Classifiers
Xueqi Dang; Yinghua Li; Mike Papadakis; Jacques Klein; Tegawendé F. Bissyandé; Yves Le Traon
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Software Engineering
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1109/tse.2024.3350019
The original publisher provides the full text and its access options.
Cite this source
Xueqi Dang; Yinghua Li; Mike Papadakis; Jacques Klein; Tegawendé F. Bissyandé; Yves Le Traon. Test Input Prioritization for Machine Learning Classifiers. IEEE Transactions on Software Engineering. 2024-03. https://doi.org/10.1109/tse.2024.3350019