Repetitive Pulse Testing for LDMOS Transistor Reliability
Tianjiao Liu; Michael Cook; Chris Kendrick
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Reliability Physics Symposium (IRPS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/irps48228.2024.10529360
The original publisher provides the full text and its access options.
Cite this source
Tianjiao Liu; Michael Cook; Chris Kendrick. Repetitive Pulse Testing for LDMOS Transistor Reliability. 2024 IEEE International Reliability Physics Symposium (IRPS). 2024-04-14. https://doi.org/10.1109/irps48228.2024.10529360