Leveraging Process Fundamentals to Improve Semiconductor Thickness Control and Uniformity in Inkjet-Printed Schottky Diodes
Jonathan D. Nguyen; Satish Kumar; C. Daniel Frisbie; Lorraine F. Francis
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- ACS Applied Engineering Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acsaenm.3c00768
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Cite this source
Jonathan D. Nguyen; Satish Kumar; C. Daniel Frisbie; Lorraine F. Francis. Leveraging Process Fundamentals to Improve Semiconductor Thickness Control and Uniformity in Inkjet-Printed Schottky Diodes. ACS Applied Engineering Materials. 2024-02-19. https://doi.org/10.1021/acsaenm.3c00768