Automatic Identification of Surface Defects in Semiconductor Materials Based on Machine Learning
Huan Li
- Published
- Publisher
- Erdos Publish House
- Journal / collection
- Applied Mathematics and Nonlinear Sciences
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.2478/amns-2025-0271
The original publisher provides the full text and its access options.
Cite this source
Huan Li. Automatic Identification of Surface Defects in Semiconductor Materials Based on Machine Learning. Applied Mathematics and Nonlinear Sciences. 2025-01-01. https://doi.org/10.2478/amns-2025-0271