Lifetime Prediction of Electrothermally-Stressed Semiconductor Devices in Si/SiC H-ANPC Inverter
Nanditha Gajanur; Mohammad A. Abbaszada; Sudip K. Mazumder; Matt Ursino; Patrick McCluskey
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE Energy Conversion Congress and Exposition (ECCE)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ecce55643.2024.10861730
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Cite this source
Nanditha Gajanur; Mohammad A. Abbaszada; Sudip K. Mazumder; Matt Ursino; Patrick McCluskey. Lifetime Prediction of Electrothermally-Stressed Semiconductor Devices in Si/SiC H-ANPC Inverter. 2024 IEEE Energy Conversion Congress and Exposition (ECCE). 2024-10-20. https://doi.org/10.1109/ecce55643.2024.10861730