Ensuring Reliable Operation of a Semiconductor Transistor When Exposed to High Temperatures
Elmira Kazalieva; Aishat Shakhmayeva
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Seminar on Electron Devices Design and Production (SED)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/sed63331.2024.10741071
The original publisher provides the full text and its access options.
Cite this source
Elmira Kazalieva; Aishat Shakhmayeva. Ensuring Reliable Operation of a Semiconductor Transistor When Exposed to High Temperatures. 2024 International Seminar on Electron Devices Design and Production (SED). 2024-10-02. https://doi.org/10.1109/sed63331.2024.10741071