Low-Cost Embedded Instrumentation for Automated Semiconductor Diode Characterization
Teja Venkata Sai Naveen Vuddagiri; Colby Baldwin; Sandip Das
- Published
- Publisher
- IEEE
- Journal / collection
- SoutheastCon 2025
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/southeastcon56624.2025.10971564
The original publisher provides the full text and its access options.
Cite this source
Teja Venkata Sai Naveen Vuddagiri; Colby Baldwin; Sandip Das. Low-Cost Embedded Instrumentation for Automated Semiconductor Diode Characterization. SoutheastCon 2025. 2025-03-22. https://doi.org/10.1109/southeastcon56624.2025.10971564