The Value of ALD Oxide Semiconductor Thin Film Transistor Beyond Mobility-Reliability Trade-Off
Yoon-Seo Kim; Jin-Seong Park
- Published
- Publisher
- International Display Workshops General Incorporated Association
- Journal / collection
- Proceedings of the International Display Workshops
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.36463/idw.2024.0200
The original publisher provides the full text and its access options.
Cite this source
Yoon-Seo Kim; Jin-Seong Park. The Value of ALD Oxide Semiconductor Thin Film Transistor Beyond Mobility-Reliability Trade-Off. Proceedings of the International Display Workshops. 2024-12-05. https://doi.org/10.36463/idw.2024.0200