Wafer Fault detection in manufacturing using Machine Learning
Navneet Pratap Singh; Atrija Haldar; Mehul Pathak; Bhavya Vats
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Conference on Computer Vision and Machine Intelligence (CVMI)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/cvmi61877.2024.10782617
The original publisher provides the full text and its access options.
Cite this source
Navneet Pratap Singh; Atrija Haldar; Mehul Pathak; Bhavya Vats. Wafer Fault detection in manufacturing using Machine Learning. 2024 IEEE International Conference on Computer Vision and Machine Intelligence (CVMI). 2024-10-19. https://doi.org/10.1109/cvmi61877.2024.10782617