Quantifying the Contact Resistance Components in Oxide Thin-Film Transistor
Wenhui Wang; Zelin Yuan; Haoran Peng; Panpan Zhang; Yida Li
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Electron Device Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/led.2026.3719158
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Cite this source
Wenhui Wang; Zelin Yuan; Haoran Peng; Panpan Zhang; Yida Li. Quantifying the Contact Resistance Components in Oxide Thin-Film Transistor. IEEE Electron Device Letters. 2026-10. https://doi.org/10.1109/led.2026.3719158