Insights Into Threshold Voltage Variability in Negative Capacitance Junctionless Transistor
Ruma S. R.; Vita-Pi Ho Hu; Manish Gupta
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of the Electron Devices Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jeds.2024.3505620
The original publisher provides the full text and its access options.
Cite this source
Ruma S. R.; Vita-Pi Ho Hu; Manish Gupta. Insights Into Threshold Voltage Variability in Negative Capacitance Junctionless Transistor. IEEE Journal of the Electron Devices Society. 2025. https://doi.org/10.1109/jeds.2024.3505620