KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology
Wei W Xing; Weijian Fan; Zhuohua Liu; Yuan Yao; Yuanqi Hu
- Published
- Publisher
- ACM
- Journal / collection
- Proceedings of the 61st ACM/IEEE Design Automation Conference
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1145/3649329.3657380
The original publisher provides the full text and its access options.
Cite this source
Wei W Xing; Weijian Fan; Zhuohua Liu; Yuan Yao; Yuanqi Hu. KATO: Knowledge Alignment And Transfer for Transistor Sizing Of Different Design and Technology. Proceedings of the 61st ACM/IEEE Design Automation Conference. 2024-06-23. https://doi.org/10.1145/3649329.3657380