Investigation of Reconfigurable Logic Gate Using Integrated Amorphous Ingazno Reram and Thin-Film Transistor
Jung Rae Cho; Jingyu Park; Seung Joo Myoung; Tae Jun Yang; Changwook Kim; Jong-Ho Bae; Sung-Jin Choi; Dong Myong Kim; Ickhyun Song; Dae Hwan Kim
- Published
- Publisher
- Elsevier BV
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.2139/ssrn.4935990
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Cite this source
Jung Rae Cho; Jingyu Park; Seung Joo Myoung; Tae Jun Yang; Changwook Kim; Jong-Ho Bae; Sung-Jin Choi; Dong Myong Kim; Ickhyun Song; Dae Hwan Kim. Investigation of Reconfigurable Logic Gate Using Integrated Amorphous Ingazno Reram and Thin-Film Transistor. Elsevier BV. 2024. https://doi.org/10.2139/ssrn.4935990