To Assess Radiation Susceptibility of Semiconductor Devices Base on Similarity Principle
Hongmin Liu; Weng Zheng; Ruixuan Li; Jiaqiang Liu; Shuai Cui
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.36227/techrxiv.170862200.02329212/v1
This is a preprint or other posted paper. Check the original source for its review and publication status.
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Cite this source
Hongmin Liu; Weng Zheng; Ruixuan Li; Jiaqiang Liu; Shuai Cui. To Assess Radiation Susceptibility of Semiconductor Devices Base on Similarity Principle. Institute of Electrical and Electronics Engineers (IEEE). 2024-02-22. https://doi.org/10.36227/techrxiv.170862200.02329212/v1