TCAD Simulations of Reconfigurable Field-Effect Transistor With Embedded-Fin-Contact to Improve On-Current
Chao Wang; Junfeng Hu; Ziyu Liu; Xiaojin Li; Yanling Shi; Yabin Sun
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2024.3375829
The original publisher provides the full text and its access options.
Cite this source
Chao Wang; Junfeng Hu; Ziyu Liu; Xiaojin Li; Yanling Shi; Yabin Sun. TCAD Simulations of Reconfigurable Field-Effect Transistor With Embedded-Fin-Contact to Improve On-Current. IEEE Transactions on Electron Devices. 2024-05. https://doi.org/10.1109/ted.2024.3375829