Analyzing Work Function Dependency for Doping Variations in Double Gate Junction Less Field Effect Transistor: A TCAD Simulation Perception
Panchita Saikia; Apurba Kumar Raibaruah; Kaushik Chandra Deva Sarma
- Published
- Publisher
- RSP Science Hub
- Journal / collection
- International Research Journal on Advanced Engineering Hub (IRJAEH)
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.47392/irjaeh.2024.0328
The original publisher provides the full text and its access options.
Cite this source
Panchita Saikia; Apurba Kumar Raibaruah; Kaushik Chandra Deva Sarma. Analyzing Work Function Dependency for Doping Variations in Double Gate Junction Less Field Effect Transistor: A TCAD Simulation Perception. International Research Journal on Advanced Engineering Hub (IRJAEH). 2024-09-26. https://doi.org/10.47392/irjaeh.2024.0328