Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

A Theoretical Framework for Ensuring Safety in Semiconductor Manufacturing through Process Optimization and Risk Assessment

Enoch Oluwadunmininu Ogunnowo; Elemele Ogu; Peter Ifechukwude Egbumokei; Ikiomoworio Nicholas Dienagha; Wags Numoipiri Digitemie

Published
Publisher
Sciencedomain International
Journal / collection
Journal of Materials Science Research and Reviews
Research area
Semiconductors
Source type
Journal article
DOI
10.9734/jmsrr/2025/v8i1388

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Enoch Oluwadunmininu Ogunnowo; Elemele Ogu; Peter Ifechukwude Egbumokei; Ikiomoworio Nicholas Dienagha; Wags Numoipiri Digitemie. A Theoretical Framework for Ensuring Safety in Semiconductor Manufacturing through Process Optimization and Risk Assessment. Journal of Materials Science Research and Reviews. 2025-02-14. https://doi.org/10.9734/jmsrr/2025/v8i1388

Download RIS