Dopant-Dependent Flicker Noise of Hafnium Oxide Ferroelectric Field Effect Transistor
Daniel Hessler; Ricardo Olivo; Konrad Seidel; Raik Hoffmann; Sourav De; Yannick Raffel
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/edtm58488.2024.10512251
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Cite this source
Daniel Hessler; Ricardo Olivo; Konrad Seidel; Raik Hoffmann; Sourav De; Yannick Raffel. Dopant-Dependent Flicker Noise of Hafnium Oxide Ferroelectric Field Effect Transistor. 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). 2024-03-03. https://doi.org/10.1109/edtm58488.2024.10512251