Modeling carrier trapping at semiconductor/dielectric interfaces based on first-principles calculations of nonradiative capture
Yongjin Shin; Mark E. Turiansky; Darshana Wickramaratne; Byounghak Lee; Chris G. Van de Walle
- Published
- Publisher
- AIP Publishing
- Journal / collection
- Journal of Applied Physics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0243726
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Cite this source
Yongjin Shin; Mark E. Turiansky; Darshana Wickramaratne; Byounghak Lee; Chris G. Van de Walle. Modeling carrier trapping at semiconductor/dielectric interfaces based on first-principles calculations of nonradiative capture. Journal of Applied Physics. 2025-02-10. https://doi.org/10.1063/5.0243726