Reliability Prediction of Radiation Induced Failures in Semiconductor Packages
Ashok Alagappan; Masoud Rostami-Angas
- Published
- Publisher
- IMAPS - International Microelectronics Assembly and Packaging Society
- Journal / collection
- IMAPSource Proceedings
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.4071/001c.94478
The original publisher provides the full text and its access options.
Cite this source
Ashok Alagappan; Masoud Rostami-Angas. Reliability Prediction of Radiation Induced Failures in Semiconductor Packages. IMAPSource Proceedings. 2024-02-29. https://doi.org/10.4071/001c.94478