Cubic Boron Arsenide MOSFETs: A DC Characterization study for Next Generation Semiconductor Devices
P. Harikrishnan; P. Sivakumar
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 Control Instrumentation System Conference (CISCON)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ciscon62171.2024.10696506
The original publisher provides the full text and its access options.
Cite this source
P. Harikrishnan; P. Sivakumar. Cubic Boron Arsenide MOSFETs: A DC Characterization study for Next Generation Semiconductor Devices. 2024 Control Instrumentation System Conference (CISCON). 2024-08-02. https://doi.org/10.1109/ciscon62171.2024.10696506