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Research literature / Conference paper

Electrical Characterization of Direct Bandgap Semiconductor for Radiation Detectors

Satyarth Tiwari; Sanjay Kumar Sharma

Published
Publisher
IEEE
Journal / collection
2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/iconstem60960.2024.10568858

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Satyarth Tiwari; Sanjay Kumar Sharma. Electrical Characterization of Direct Bandgap Semiconductor for Radiation Detectors. 2024 Ninth International Conference on Science Technology Engineering and Mathematics (ICONSTEM). 2024-04-04. https://doi.org/10.1109/iconstem60960.2024.10568858

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