Machine learning-enhanced detection of minor radiation-induced defects in semiconductor materials using Raman spectroscopy
Jia Yi Chia; Nuatawan Thamrongsiripak; Sornwit Thongphanit; Noppadon Nuntawong
- Published
- Publisher
- AIP Publishing
- Journal / collection
- Journal of Applied Physics
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1063/5.0179881
The original publisher provides the full text and its access options.
Cite this source
Jia Yi Chia; Nuatawan Thamrongsiripak; Sornwit Thongphanit; Noppadon Nuntawong. Machine learning-enhanced detection of minor radiation-induced defects in semiconductor materials using Raman spectroscopy. Journal of Applied Physics. 2024-01-08. https://doi.org/10.1063/5.0179881