18‐4: Mechanical Stress‐Induced Recoverable and Unrecoverable Deteriorations of Flexible a‐InGaZnO Thin‐Film Transistor
Jilin Li; Bowen Sun; Huan Yang; Runxiao Shi; Fion Sze Yan Yeung; Man Hoi Wong; Hailong Jiao; Shengdong Zhang; Lei Lu
- Published
- Publisher
- Wiley
- Journal / collection
- SID Symposium Digest of Technical Papers
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/sdtp.17025
The original publisher provides the full text and its access options.
Cite this source
Jilin Li; Bowen Sun; Huan Yang; Runxiao Shi; Fion Sze Yan Yeung; Man Hoi Wong; Hailong Jiao; Shengdong Zhang; Lei Lu. 18‐4: Mechanical Stress‐Induced Recoverable and Unrecoverable Deteriorations of Flexible a‐InGaZnO Thin‐Film Transistor. SID Symposium Digest of Technical Papers. 2024-04. https://doi.org/10.1002/sdtp.17025