Automatic Temperature Analysis of an Image Sensor using an Application in a Semiconductor Industry
Chanathip Wongsomboon; Noppadol Maneerat; Jakkrit Thudthong; Sutikamon Sukasem; Kuniaki Yajima; Bundit Pasaya
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 10th International Conference on Engineering, Applied Sciences, and Technology (ICEAST)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iceast61342.2024.10553998
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Cite this source
Chanathip Wongsomboon; Noppadol Maneerat; Jakkrit Thudthong; Sutikamon Sukasem; Kuniaki Yajima; Bundit Pasaya. Automatic Temperature Analysis of an Image Sensor using an Application in a Semiconductor Industry. 2024 10th International Conference on Engineering, Applied Sciences, and Technology (ICEAST). 2024-05-01. https://doi.org/10.1109/iceast61342.2024.10553998