Intrinsic field-effect mobility in thin-film transistor with polycrystalline In 2 O 3 channel based on transfer length method
Takanori Takahashi; Yukiharu Uraoka
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Applied Physics Express
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.35848/1882-0786/ada19e
The original publisher provides the full text and its access options.
Cite this source
Takanori Takahashi; Yukiharu Uraoka. Intrinsic field-effect mobility in thin-film transistor with polycrystalline In 2 O 3 channel based on transfer length method. Applied Physics Express. 2025-01-01. https://doi.org/10.35848/1882-0786/ada19e