Manufacturing Domain QA with Integrated Term Enhanced RAG
Yijun Bei; Zhibin Fang; Shenyu Mao; Shuyi Yu; Yan Jiang; Yining Tong; Weimin Cai
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Joint Conference on Neural Networks (IJCNN)
- Research area
- Industrial systems
- Source type
- Conference paper
- DOI
- 10.1109/ijcnn60899.2024.10649905
The original publisher provides the full text and its access options.
Cite this source
Yijun Bei; Zhibin Fang; Shenyu Mao; Shuyi Yu; Yan Jiang; Yining Tong; Weimin Cai. Manufacturing Domain QA with Integrated Term Enhanced RAG. 2024 International Joint Conference on Neural Networks (IJCNN). 2024-06-30. https://doi.org/10.1109/ijcnn60899.2024.10649905