Simultaneous analysis of the stochastic transistor aging and process variation in digital systems by developing machine learning-based models for standard cells
Mohammad Bazli; Siavash Es'haghi; Mahmood Shahi; Majid Naseh
- Published
- Publisher
- Apex Publishing
- Journal / collection
- Journal of Iranian Association of Electrical and Electronics Engineers
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.61186/jiaeee.22.1.65
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Cite this source
Mohammad Bazli; Siavash Es'haghi; Mahmood Shahi; Majid Naseh. Simultaneous analysis of the stochastic transistor aging and process variation in digital systems by developing machine learning-based models for standard cells. Journal of Iranian Association of Electrical and Electronics Engineers. 2025-04-01. https://doi.org/10.61186/jiaeee.22.1.65