A multi-source data fusion driven power field effect transistor health state assessment and remaining useful life prediction method
Gaige Chen; Yuzhe Zhang; Jun Huang; Xianzhi Wang; Xianguang Kong
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Measurement Science and Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1088/1361-6501/ad6f36
The original publisher provides the full text and its access options.
Cite this source
Gaige Chen; Yuzhe Zhang; Jun Huang; Xianzhi Wang; Xianguang Kong. A multi-source data fusion driven power field effect transistor health state assessment and remaining useful life prediction method. Measurement Science and Technology. 2024-08-27. https://doi.org/10.1088/1361-6501/ad6f36