Classification of Semiconductor Defects Using Few Shot Learning with Sythetic Minority Oversampling Technique
Hassan Mohamed; Sowmyashree M S; K. Balageeta; Naveen I G; G. Vijayakumari
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 4th International Conference on Mobile Networks and Wireless Communications (ICMNWC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icmnwc63764.2024.10872109
The original publisher provides the full text and its access options.
Cite this source
Hassan Mohamed; Sowmyashree M S; K. Balageeta; Naveen I G; G. Vijayakumari. Classification of Semiconductor Defects Using Few Shot Learning with Sythetic Minority Oversampling Technique. 2024 4th International Conference on Mobile Networks and Wireless Communications (ICMNWC). 2024-12-04. https://doi.org/10.1109/icmnwc63764.2024.10872109