Transistor Aging and Circuit Reliability at Cryogenic Temperatures
Javier Diaz-Fortuny; Vishal Nayar
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 Design, Automation & Test in Europe Conference (DATE)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.23919/date64628.2025.10992904
The original publisher provides the full text and its access options.
Cite this source
Javier Diaz-Fortuny; Vishal Nayar. Transistor Aging and Circuit Reliability at Cryogenic Temperatures. 2025 Design, Automation & Test in Europe Conference (DATE). 2025-03-31. https://doi.org/10.23919/date64628.2025.10992904