A screening method of retired insulated gate bipolar transistor for reuse based on multiple indicators and integrated model
He Liu; Xinyu Li; Zhifeng Liu
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.microrel.2024.115356
The original publisher provides the full text and its access options.
Cite this source
He Liu; Xinyu Li; Zhifeng Liu. A screening method of retired insulated gate bipolar transistor for reuse based on multiple indicators and integrated model. Microelectronics Reliability. 2024-04. https://doi.org/10.1016/j.microrel.2024.115356