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Research literature / Conference paper

Evaluating Room-Temperature Semiconductor Technology for Nuclear On-site Verification

Y. Kim; M. Kim; G. Kim; J. Jang; H. Kim; H. Chung

Published
Publisher
IEEE
Journal / collection
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/nss/mic/rtsd57108.2024.10656561

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Y. Kim; M. Kim; G. Kim; J. Jang; H. Kim; H. Chung. Evaluating Room-Temperature Semiconductor Technology for Nuclear On-site Verification. 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD). 2024-10-26. https://doi.org/10.1109/nss/mic/rtsd57108.2024.10656561

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