Temperature dependence of hole mobility in methylated germanane field-effect transistor
Yuuki Hiraoka; Yudai Suzuki; Kouhei Hachiya; Atsuki Nakayama; Hiroshi Tabata; Mitsuhiro Katayama; Osamu Kubo
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Japanese Journal of Applied Physics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.35848/1347-4065/ad30a2
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Cite this source
Yuuki Hiraoka; Yudai Suzuki; Kouhei Hachiya; Atsuki Nakayama; Hiroshi Tabata; Mitsuhiro Katayama; Osamu Kubo. Temperature dependence of hole mobility in methylated germanane field-effect transistor. Japanese Journal of Applied Physics. 2024-03-01. https://doi.org/10.35848/1347-4065/ad30a2