Drag of electron–hole bilayer in silicon-on-insulator metal-oxide-semiconductor field-effect transistor at low temperature
Nabil Ahmed; Manjakavahoaka Razanoelina; Masahiro Hori; Akira Fujiwara; Yukinori Ono
- Published
- Publisher
- IOP Publishing
- Journal / collection
- Applied Physics Express
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.35848/1882-0786/ad5073
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Cite this source
Nabil Ahmed; Manjakavahoaka Razanoelina; Masahiro Hori; Akira Fujiwara; Yukinori Ono. Drag of electron–hole bilayer in silicon-on-insulator metal-oxide-semiconductor field-effect transistor at low temperature. Applied Physics Express. 2024-06-01. https://doi.org/10.35848/1882-0786/ad5073