Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Digital Twin Based Uncertainty Informed Time Constraint Control in Semiconductor Manufacturing

Marvin Carl May; Lars Kiefer; Gisela Lanza

Published
Publisher
IEEE
Journal / collection
2024 Winter Simulation Conference (WSC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/wsc63780.2024.10838845

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Marvin Carl May; Lars Kiefer; Gisela Lanza. Digital Twin Based Uncertainty Informed Time Constraint Control in Semiconductor Manufacturing. 2024 Winter Simulation Conference (WSC). 2024-12-15. https://doi.org/10.1109/wsc63780.2024.10838845

Download RIS