Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Optimization of Stress Stability and Electrical Properties of Zinc Oxide Thin-Film Transistor

朋 肖

Published
Publisher
Hans Publishers
Journal / collection
Journal of Sensor Technology and Application
Research area
Semiconductors
Source type
Journal article
DOI
10.12677/jsta.2024.126091

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

朋 肖. Optimization of Stress Stability and Electrical Properties of Zinc Oxide Thin-Film Transistor. Journal of Sensor Technology and Application. 2024. https://doi.org/10.12677/jsta.2024.126091

Download RIS