Frequency Noise Characterization of Narrow-Linewidth Semiconductor Lasers: A Bayesian Approach
Lutz Mertenskötter; Markus Kantner
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Photonics Journal
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jphot.2024.3385184
The original publisher provides the full text and its access options.
Cite this source
Lutz Mertenskötter; Markus Kantner. Frequency Noise Characterization of Narrow-Linewidth Semiconductor Lasers: A Bayesian Approach. IEEE Photonics Journal. 2024-06. https://doi.org/10.1109/jphot.2024.3385184