Interacting random-field dipole defect model for heating in semiconductor-based qubit devices
Yujun Choi; Robert Joynt
- Published
- Publisher
- American Physical Society (APS)
- Journal / collection
- Physical Review Research
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1103/physrevresearch.6.013168
The original publisher provides the full text and its access options.
Cite this source
Yujun Choi; Robert Joynt. Interacting random-field dipole defect model for heating in semiconductor-based qubit devices. Physical Review Research. 2024-02-14. https://doi.org/10.1103/physrevresearch.6.013168